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Publications by P. Germi
X-Ray Texture Analysis of Thin Films by the Reflection Method: Intermediate Regime in Defocusing Corrections
Journal of Applied Crystallography
Biochemistry
Genetics
Molecular Biology
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Probing Molecular Orientations in Thin Films by X-Ray Photoelectron Spectroscopy
AIP Advances
Nanotechnology
Astronomy
Physics
Nanoscience
X‐ray Diffractometer Stage for in Situ Structural Analysis of Thin Films
Review of Scientific Instruments
Medicine
Instrumentation
Buried Antiferromagnetic Films Investigated by X-Ray Magneto-Optical Reflection Spectroscopy
Physical Review B
Characterization of Thin Polymer Films by Neutron and X-Ray Reflectometry
Kobunshi
Materials Science
Polymers
Plastics
Chemical Engineering
Environmental Science
Determination of Secondary Phases in Kesterite Cu2ZnSnS4 Thin Films by X-Ray Absorption Near Edge Structure Analysis
Applied Physics Letters
Astronomy
Physics
Synchrotron X-Ray Diffraction Analysis of Cyclic Deformation Behaviour of Thin Gold Films
International Journal of Theoretical and Applied Multiscale Mechanics
X-Ray Photoelectron Spectroscopy Study of MgH2 Thin Films Grown by Reactive Sputtering
Surface and Interface Analysis
Surfaces
Condensed Matter Physics
Interfaces
Materials Chemistry
Films
Coatings
Chemistry
Intermetallic Texture Analysis by X-Ray, Neutron and Electron Backscattered Diffraction
Le Journal de Physique IV
X-Ray Diffraction Method for Determination of Texture Evolution in Layers
Textures and Microstructures