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Publications by P. M. Campbell
Si Nanostructures Fabricated by Anodic Oxidation With an Atomic Force Microscope and Etching With an Electron Cyclotron Resonance Source
Applied Physics Letters
Astronomy
Physics
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The Initial Stages of Atomic Force Microscope Based Local Anodic Oxidation of Silicon
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Surface Morphology of DLC Films Observed With an Atomic Force Microscope.
SHINKU
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TRANSACTIONS OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES, AEROSPACE TECHNOLOGY JAPAN
Pulsed Laser Reactive Deposition of P-Type ZnO Film Enhanced by an Electron Cyclotron Resonance Source
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Measuring Boltzmann’s Constant With a Low-Cost Atomic Force Microscope: An Undergraduate Experiment
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Measuring Adhesion, Attraction, and Repulsion Between Surfaces in Liquids With an Atomic-Force Microscope
Physical Review B