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Publications by P. M. Reimer
Interfacial Roughness in (111)-Oriented Si/Si1−xGexmultilayers
Acta Crystallographica Section A Foundations of Crystallography
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HRTEM and EELS Analysis of Interfacial Reactions in Ti/Si1-xGex/Si(100)
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Improved Hole Mobilities and Thermal Stability in a Strained‐Si∕strained‐Si1−yGey∕strained‐Si Heterostructure Grown on a Relaxed Si1−xGex Buffer
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Deep Photoluminescence in Si/Si1−xGex/Si Quantum Wells Created by Ion Implantation and Annealing
Applied Physics Letters
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Bandgap Narrowing in Heavily Doped Base Regions of Si/Si1-xGex/Si Heterojunction Bipolar Transistors.
Characterizing Interfacial Roughness by Light Scattering Ellipsometry
AIP Conference Proceedings
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INTERFACIAL DEFECTS IN GaAs/Si AFTER ANNEALING
Le Journal de Physique Colloques
Selective Formation of Large-Grained, (100)- Or (111)-Oriented Si on Glass by Al-Induced Layer Exchange
Journal of Applied Physics
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Growth of Highly Oriented Crystalline Α-Fe/AlN/Fe3N Trilayer Structures on Si(111) Substrates by Molecular Beam Epitaxy
Journal of Crystal Growth
Inorganic Chemistry
Materials Chemistry
Condensed Matter Physics
Misoriented Epitaxial Growth of (111)CoSi 2 on Offset (111)Si Substrates
Materials Research Society Symposium - Proceedings
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Materials Science
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Mechanical Engineering
