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Publications by P. Mur

A Combined FEG-SEM and TEM Study of Silicon Nanodot Assembly

EPJ Applied Physics
InstrumentationOpticalElectronicCondensed Matter PhysicsMagnetic Materials
2008English

Kinetic Roughening of Charge Spreading in a Two-Dimensional Silicon Nanocrystal Network Detected by Electrostatic Force Microscopy

Physical Review B
2005English

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SEM and TEM Study of MTO Catalyst Molecular Sieve ZSM-5

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What Is the Dual-Detector FEG SEM, and Why Use It?

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1999English

Self-Assembly and Optical Properties of Patterned ZnO Nanodot Arrays

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The Versatile FEG-SEM: From Ultra-High Resolution to Ultra-High Surface Sensitivity

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622 Giardiasis, Mucus and Malabsorption. A Scanning (Sem) and Transmission (Tem) Electron Microscopic Study of Small Bowel Mucosa

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