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Publications by P. Paufler
Structural Chemistry of BaAl4/ThCr2Si2type Compounds
Acta Crystallographica Section A Foundations of Crystallography
Structural and Mechanical Characterisation of TiC/VC Multilayers Using XRD, Polarized EXAFS and Nanoindentation
Acta Crystallographica Section A Foundations of Crystallography
Slip Line Resolution in Atomic Range on Plastically deformedAIII-BVsemiconductor Surface by Scanning Force Microscopy
Acta Crystallographica Section A Foundations of Crystallography
Handbook of X-Ray data.By G. Zschornack. Pp. IX + 967. Berlin: Springer-Verlag, 2007. Price (Hardback) EUR 213.95. ISBN 978-3-540-28618-9.
Acta Crystallographica Section A Foundations of Crystallography
