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Publications by Peng Soon Lim
Stress-Induced Leakage Current and Lateral Nonuniform Charge Generation in Thermal Oxides Subjected to Negative-Gate-Voltage Impulse Stressing
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Related publications
Common Origin of Stress-Induced Leakage Current and Electron Trap Generation
Stress Induced in Short Cylinders Subjected to Axial Deformation and Lateral Pressures.
Soils and Foundations
Civil
Geotechnical Engineering
Engineering Geology
Structural Engineering
Correlation Between Hot Carrier Stress, Oxide Breakdown and Gate Leakage Current for Monitoring Plasma Processing Induced Damage on Gate Oxide
Interface Trap Effect on Gate Induced Drain Leakage Current in Submicron N-MOSFET's
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Investigation of Gate-Induced Drain Leakage (GIDL) Current in Thin Body Devices: Single-Gate Ultra-Thin Body, Symmetrical Double-Gate, and Asymmetrical Double-Gate MOSFETs
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Model and Analysis of Gate Leakage Current in Ultrathin Nitrided Oxide MOSFETs
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Charge Order and Negative Thermal Expansion in V2OPO4
Gate Replacement Technique for Reducing Leakage Current in Wallace Tree Multiplier
Journal of Computer Science
Computer Networks
Software
Artificial Intelligence
Communications
Coherence and Time-Frequency Analysis of Impulse Voltage and Current Measurements
Journal of Energy in Southern Africa
Energy
Computer Science
