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Publications by Peter Moeck
Information Theory Based Crystallographic Symmetry Classifications of a Noisy 2D Periodic Scanning Tunneling Microscope Image
Microscopy and Microanalysis
Instrumentation
Unambiguous Detections of the Plane Symmetries That Noisy Experimental Images From Naturally Formed 2D Periodic Arrays of Physical Objects Most Likely Possess
Microscopy and Microanalysis
Instrumentation
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