Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by Philip Noell
A Method for Plan-View FIB Liftout of Near Surface Defects With Minimal Beam-Induced Damage
Microscopy and Microanalysis
Instrumentation
Related publications
A Plan-View TEM Specimen Preparation Method Using Focused Ion Beam
Microscopy and Microanalysis
Instrumentation
Review on FIB-Induced Damage in Diamond Materials
Current Nanoscience
Pharmaceutical Science
Nanoscience
Bioengineering
Medicine
Biotechnology
Nanotechnology
Biomedical Engineering
FIB Damage Reduction Technique in TEM Membrane Using Triple Beam System
Microscopy and Microanalysis
Instrumentation
Observation of FIB Induced Damage in Fe-Cr Alloy
Microscopy and Microanalysis
Instrumentation
A Non-Destructive Method for Assessing Interior and Surface Hair Damage by Near Infrared Spectroscopy
Journal of Society of Cosmetic Chemists of Japan
FIB-TEM Characterization of Surface and Sub-Surface Defects Introduced Into Lithium Niobate by a Femtosecond Laser
Microscopy and Microanalysis
Instrumentation
Development of a New Focused Ion Beam Preparation Method of Thin Film for TEM With FIB: A Method Capable of Re-Thinning After TEM Observation
Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
Mechanics of Materials
Alloys
Materials Chemistry
Condensed Matter Physics
Metals
FIB Dual-Beam Sample Preparation for TEM Observation
Microscopy and Microanalysis
Instrumentation
Minimal Resin Embedding of Multicellular Specimens for Targeted FIB-SEM Imaging
Microscopy and Microanalysis
Instrumentation
