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Publications by Philipp Niedermann
Ballistic Electron Emission Microscopy Study of PtSi–n-Si(100) Schottky Diodes
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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Quantum Well Behavior of Single Stacking Fault 3C Inclusions in 4h-SiC P-I-N Diodes Studied by Ballistic Electron Emission Microscopy
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Ballistic Electron Emission Microscopy Spectroscopy Study of AlSb and InAs/AlSb Superlattice Barriers
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INTERNAL PHOTOEMISSION SPECTROSCOPY FOR a PtSi/p-Si SCHOTTKY JUNCTION
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Ohmic Contacts Study of P+N Diodes on (111) and (100) Diamond
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