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Publications by Philippe T. Pinard
Electron Probe Microanalysis of Ni Silicides Using Ni-L X-Ray Lines – ERRATUM
Microscopy and Microanalysis
Instrumentation
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Designing the Optimal Quantitative Electron Probe X-Ray Microanalysis Measurement
Microscopy and Microanalysis
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Electron Probe X-Ray Microanalysis Investigations of Powder Rock Reference Materials
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Analytical Chemistry
Studies of Electron Diffusion in Photo-Excited Ni Using Time-Resolved X-Ray Diffraction
Applied Physics Letters
Astronomy
Physics
Ion Distribution in Roots of Barley Seedlings Measured by Electron Probe X-Ray Microanalysis
Plant Physiology
Plant Science
Genetics
Physiology
Microwave Absorption Properties of Ni/(C, Silicides) Nanocapsules
Nanoscale Research Letters
Materials Science
Nanotechnology
Condensed Matter Physics
Nanoscience
Erratum to : X-Ray Stress Measurement of 18 Cr-8 Ni Austenitic Stainless Steel
Zairyo/Journal of the Society of Materials Science, Japan
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
New Calculations of Inner Shell X-Ray Lines in Ti, Cr, and Ni as Density Diagnostics
International Astronomical Union Colloquium
Computer Program for Electron Probe Microanalysis
Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan
Alloys
Condensed Matter Physics
Metals
Theoretical Chemistry
Materials Chemistry
Physical
X-Ray Microanalysis Artifacts Visualized
Microscopy and Microanalysis
Instrumentation
