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Publications by Phillip S. Dobson
Quantification of Atomic Force Microscopy Tip and Sample Thermal Contact
Review of Scientific Instruments
Medicine
Instrumentation
Related publications
Contact-Resonance Atomic Force Microscopy for Viscoelasticity
Journal of Applied Physics
Astronomy
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Non-Contact Atomic-Level Interfacial Force Microscopy
A Near Real-Time Framework for Extracting Tip-Sample Forces in Dynamic Atomic Force Microscopy
Frequency Modulated Atomic Force Microscopy on MgO(001) Thin Films: Interpretation of Atomic Image Resolution and Distance Dependence of Tip–sample Interaction
Nanotechnology
Mechanics of Materials
Electronic Engineering
Mechanical Engineering
Materials Science
Nanoscience
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Bioengineering
Nanotechnology
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Tip-Sample Distance Control Using Photothermal Actuation of a Small Cantilever for High-Speed Atomic Force Microscopy
Review of Scientific Instruments
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Pulsed Contact Resonance for Atomic Force Microscopy Nanomechanical Measurements
Applied Physics Letters
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Evaluation of Tip Performance by XE-100 Atomic Force Microscopy (AFM)
Microscopy and Microanalysis
Instrumentation
Atomic Force Microscopy
Reproducible Nanostructure Fabrication Using Atomic Force Microscopy Indentation With Minimal Tip Damage
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology
