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Publications by Pierrette Rivallin

Extending the Detection Limit of Dopants for Focused Ion Beam Prepared Semiconductor Specimens Examined by Off-Axis Electron Holography

Journal of Applied Physics

English

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Quantitative Examination of Reverse-Biased Semiconductor Devices Using Off- Axis Electron Holography

Microscopy and Microanalysis

Instrumentation

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Focused Electron-Beam Induced Deposition, in Situ TEM and Off-Axis Electron Holography Investigation of Bi-Magnetic Core-Shell Nanostructures

Microscopy and Microanalysis

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English

Exit-Surface Dependency of Defocus Measured by Off-Axis Electron Holography

Microscopy and Microanalysis

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English

Characterization of Semiconductor Nanospikes Produced by Focused Ion Beam Erosion

Microscopy and Microanalysis

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English

Prospects for Off-Axis Electron Holography in the TEAM I Microscope

Microscopy and Microanalysis

Instrumentation

English

Exploring CCD Camera Parameters With Off-Axis Electron Holography

Microscopy and Microanalysis

Instrumentation

English

Superconductivity in the System MoxCyGazOδ Prepared by Focused Ion Beam Induced Deposition

Journal of Applied Physics

English

Three-Dimensional Cathodoluminescence by Focused Ion Beam - Scanning Electron Microscopy

Microscopy and Microanalysis

Instrumentation

English

Layered Semiconductor GaS Thin Film Prepared by Electron Beam Deposition Method

English