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Publications by Pilsung Kang

Overcoming the Diffraction Limit Using Multiple Light Scattering in a Highly Disordered Medium

Physical Review Letters

English

Bin2Vec: A Better Wafer Bin Map Coloring Scheme for Comprehensible Visualization and Effective Bad Wafer Classification

Applied Sciences (Switzerland)

Instrumentation

Materials Science

Computer Science Applications

Process Chemistry

Transfer Processes

English

Support Vector Class Description (SVCD): Classification in Kernel Space

Intelligent Data Analysis

Computer Vision

Pattern Recognition

Artificial Intelligence

Theoretical Computer Science

English

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