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Publications by R Egerton
3D Imaging of Si and Er Nanoclusters in Er Doped SiO1.5 Films by STEM Tomography
Microscopy and Microanalysis
Instrumentation
Related publications
Excitable Er Fraction and Quenching Phenomena in Er-dopedSiO2layers Containing Si Nanoclusters
Physical Review B
The Characteristic Carrier–Er Interaction Distance in Er-Doped a-Si/SiO2 Superlattices Formed by Ion Sputtering
Applied Physics Letters
Astronomy
Physics
ADF-STEM Imaging of Dopants and Defect Nanoclusters in Si
Microscopy and Microanalysis
Instrumentation
Efficient Energy Transfer From Si-Nanoclusters to Er Ions in Silica Induced by Substrate Heating During Deposition
Journal of Applied Physics
Astronomy
Physics
Er/Sup 3+/-Yb/Sup 3+/ and Er/Sup 3+/ Doped Fiber Lasers
Journal of Lightwave Technology
Optics
Atomic
Molecular Physics,
Amplifying Characteristics Er-Doped Chalcogenide Glass
Hemijska Industrija
Chemistry
Chemical Engineering
Structural and Optical Study of Ce Segregation in Ce-Doped SiO1.5 Thin Films
Journal of Applied Physics
Astronomy
Physics
Dielectric Properties of Er−doped HfO2 (Er∼15%) Grown by Atomic Layer Deposition for High-Κ Gate Stacks
Applied Physics Letters
Astronomy
Physics
Influence of the Annealing Temperature on the Photoluminescence of Er-Doped SiO Thin Films
Journal of Applied Physics
Astronomy
Physics