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Publications by R Schampers
High Throughput Sample Preparation and Analysis Using an Inductively Coupled Plasma (ICP) Focused Ion Beam Source
Microscopy and Microanalysis
Instrumentation
Backside TEM Sample Preparation With the Multi-Loader Flip-Stage
Microscopy and Microanalysis
Instrumentation
Related publications
High Brightness Inductively Coupled Plasma Source for High Current Focused Ion Beam Applications
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Focused Ion Beam Based Sample Preparation Techniques
Microscopy and Microanalysis
Instrumentation
Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
Inductively Coupled Plasma (ICP) Emission Spectroscopic Analysis of Manganese Minerals
Journal of the Mineralogical Society of Japan
A Sample Preparation Method for Paper Cross-Sections Using a Focused Ion Beam.
Sen'i Gakkaishi
Materials Science
Industrial
Polymers
Manufacturing Engineering
Plastics
Chemical Engineering
Focused Ion Beam: Much More Than a Sample Preparation Tool
Microscopy and Microanalysis
Instrumentation
Focused Ion Beam Preparation Techniques for EFTEM Analysis
Microscopy and Microanalysis
Instrumentation
Marriage of Focused and Broad Ion Beam: Sample Preparation Optimized for High Performance Analytical (S)TEM
Microscopy and Microanalysis
Instrumentation
Control and Analysis of Ion Species in Inductively Coupled Nitration Plasma Using a Grid System
Applied Physics Letters
Astronomy
Physics
