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Publications by R. Gauvin

Visualization and Quantification of Plastic Strain Induced by Indentation in Polycrystalline Nickel

Microscopy and Microanalysis
Instrumentation
2013English

Development of Quantitative Techniques With Time-Of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for Li Characterization in High Energy Batteries.

Microscopy and Microanalysis
Instrumentation
2017English

X-Ray Quantitative Microanalysis With an Annular Silicon Drift Detector

Microscopy and Microanalysis
Instrumentation
2013English

Method for Fabricating Submicron Silicide Structures on Silicon Using a Resistless Electron Beam Lithography Process

Applied Physics Letters
AstronomyPhysics
1997English

Utilisation of Field Emission Scanning Electron Microscopy to Characterise an Active Brazing Alloy (ABA) Produced by an Electroless Plating Technique

Microscopy and Microanalysis
Instrumentation
2002English

Charge Contrast Imaging of Gibbsite in the Variable Pressure SEM

Microscopy and Microanalysis
Instrumentation
2002English

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