Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by R. K. Vijayaraghavan
Nondestructive X-Ray Diffraction Measurement of Warpage in Silicon Dies Embedded in Integrated Circuit Packages
Journal of Applied Crystallography
Biochemistry
Genetics
Molecular Biology
Related publications
Diffraction-Plane Dependence of Elastic Constants of Silicon Nitride for X-Ray Stress Measurement.
Zairyo/Journal of the Society of Materials Science, Japan
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
X-Ray Diffraction in Liquids
Nature
Multidisciplinary
X-Ray Diffraction in Liquids
Nature
Multidisciplinary
A Precise X-Ray Diffraction Study of Elastically Deformed Silicon Monocrystals
Journal of Applied Crystallography
Biochemistry
Genetics
Molecular Biology
Measurement of Residual Stress Induced by Laser Irradiation on Grain Oriented Silicon Steel Using X-Ray Diffraction
Zairyo/Journal of the Society of Materials Science, Japan
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Coherent X-Ray Diffraction Imaging and Characterization of Strain in Silicon-On-Insulator Nanostructures
Advanced Materials
Mechanics of Materials
Materials Science
Nanotechnology
Mechanical Engineering
Nanoscience
The Measurement of Recrystallization Texture in Copper by X-Ray Diffraction and ECP
Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
Mechanics of Materials
Alloys
Materials Chemistry
Condensed Matter Physics
Metals
Local Plastic Strain Measurement by X-Ray Microbeam Diffraction Technique
Zairyo/Journal of the Society of Materials Science, Japan
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Nondestructive 3-Dimensional X-Ray Diffraction Tomography of Stress/Strain Distribution Around Fatigue Cracks in Al-Li 2090.
