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Publications by R. Treuer
Built-In Self-Diagnosis for Repairable Embedded RAMs
IEEE Design & Test of Computers
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A Self-Repairable MEMS Comb Accelerometer
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Built in Self Test for RAM Using VHDL
Fully Digital-Compatible Built-In Self-Test Solutions to Linearity Testing of Embedded Mixed-Signal Functions
Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits
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IFAC Proceedings Volumes
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