Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by R. de Reus
Interdiffusion Studies on High-Tc Superconducting YBa2Cu3O7−δ Thin Films on Si(111) With a NiSi2/ZrO2 Buffer Layer
Applied Surface Science
Surfaces
Astronomy
Condensed Matter Physics
Interfaces
Films
Coatings
Chemistry
Physics
Related publications
Physical Properties and Interface Studies of YBa2Cu3O7 Thin Films Deposited by Laser Ablation on Si (111) With Buffer Layer
Journal of the Less Common Metals
Fabrication of Superconducting YBa2Cu3O7−x Thin Films on Si Wafer via YSZ/CeO2 Buffer Layers
Journal of Superconductivity and Novel Magnetism
Optical
Electronic
Condensed Matter Physics
Magnetic Materials
Composition and Thickness of the Surface Layer on High Tc Superconducting YBa2Cu3O7 − D Thin Films, Studied by ARXPS
Journal of the Less Common Metals
High Tunabilty Ba0.6Sr0.4TiO3 Thin Films Fabricated on Pt–Si Substrates With La0.5Sr0.5CoO3 Buffer Layer
Journal of Materials Science: Materials in Electronics
Electronic Engineering
Biomedical Engineering
Condensed Matter Physics
Biomaterials
Electronic
Molecular Physics,
Biophysics
Optical
Electrical
Atomic
Magnetic Materials
Bioengineering
Optics
Interdiffusion-Blocking of Superconducting YBCO Material in MgO Buffer Layer
IEEJ Transactions on Fundamentals and Materials
Electronic Engineering
Electrical
Investigation of the Epitaxy of Thin YBa2Cu3O7−δ Films
Physica C: Superconductivity and its Applications
Electronic Engineering
Condensed Matter Physics
Energy Engineering
Optical
Electrical
Magnetic Materials
Power Technology
Electronic
High Quality InSb Films Grown on Si(111) Substrate via InSb Bi-Layer
e-Journal of Surface Science and Nanotechnology
Surfaces
Mechanics of Materials
Condensed Matter Physics
Interfaces
Nanoscience
Bioengineering
Films
Biotechnology
Coatings
Nanotechnology
High Tc Superconductive Thin Films on Semiconductor Substrates
Le Journal de Physique IV
Characterization of Sol-Gel-Derived and Crystallized HfO2, ZrO2, ZrO2-Y2O3 Thin Films on Si(001) Wafers With High Dielectric Constant