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Publications by RW O'Neill

Measuring the Roughness of Buried Interfaces in Nanostructures by Local Electrode Atom Probe (LEAP®) Analysis

Microscopy and Microanalysis

Instrumentation

English

Related publications

Configuration and Performance of a Local Electrode Atom Probe

Microscopy and Microanalysis

Instrumentation

English

First Data From a Commercial Local Electrode Atom Probe

Microscopy and Microanalysis

Instrumentation

English

Understanding Phase Stability in Multilayers by Atom Probe Analysis

Microscopy and Microanalysis

Instrumentation

English

Atom-Probe Analysis of Zircaloy

Le Journal de Physique Colloques

English

Nanostructure Analysis by Laser Assisted Atom Probe Tomography

Vacuum and Surface Science

English

Atom Probe Tomography: Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography (Adv. Mater. Interfaces 21/2017)

Advanced Materials Interfaces

Mechanics of Materials

Mechanical Engineering

English

Characterizing AFM Probe Shape^|^mdash;Measuring Morphology for Nanostructures^|^mdash;

Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering

Mechanical Engineering

English

Atomic Scale Analysis of Dopants in CMOS Structures by Atom Probe Tomography

Microscopy and Microanalysis

Instrumentation

English

Atomic Level Analysis of Surfaces by a Scanning Atom Probe (SAP)

Zairyo to Kankyo/ Corrosion Engineering

Materials Chemistry

Electrochemistry

English