Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by Ralph David Knox
X-Ray Diffraction Characterization of the Quality and Thermal Stability of II-VI Semiconductor Superlattices
Related publications
Formation Energy and Electronic Structure of II-VI/IV Semiconductor Superlattices
Acta Physica Polonica A
Astronomy
Physics
X-Ray Diffraction From Semiconductor Nanostructures
Acta Crystallographica Section A Foundations of Crystallography
High Resolution X-Ray Diffraction Analysis of InGaAs∕InP Superlattices
Journal of Applied Physics
Astronomy
Physics
X-Ray Scattering From Laterally Self-Modulated Semiconductor Superlattices
Acta Crystallographica Section A Foundations of Crystallography
Metal/Semiconductor Interfaces Studied by X-Ray Diffraction.
Materia Japan
Thermal Stability of Epitaxial Cubic-TiN/(Al,Sc)N Metal/Semiconductor Superlattices
Journal of Materials Science
Mechanics of Materials
Materials Science
Mechanical Engineering
Characterization of Surface Structure. X-Ray Surface Diffraction.
Nihon Kessho Gakkaishi
Quality Experimental and Calculated Powder X-Ray Diffraction
X-Ray Diffraction Characterization of Polymer Intercalated Graphite Oxide
Powder Diffraction
Instrumentation
Radiation
Condensed Matter Physics
Materials Science
