Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by Raymond F. Egerton
Beam-Induced Damage to Thin Specimens in an Intense Electron Probe
Microscopy and Microanalysis
Instrumentation
Related publications
Heating of Thin Foil by an Intense Relativistic Electron Beam
The Review of Laser Engineering
Electron Beam Induced Damage in Wurtzite InN
Microscopy and Microanalysis
Instrumentation
Magnetic Field Reversal Induced by an Intense Rotating Electron Beam in an Initially Neutral Gas
Applied Physics Letters
Astronomy
Physics
Pulsed Electron Beam Induced Recrystallization and Damage in GaAs
Applied Physics Letters
Astronomy
Physics
Intense Electron Beam Disruption Due to Ion Release From Surfaces
High-Energy High-Quality Electron Beam Generation by Using an Intense Laser
The Review of Laser Engineering
Intense Electron Beam Propagation Across a Magnetic Field
Thin‐oxide Charging Damage to Microelectronic Test Structures in an Electron‐cyclotron‐resonance Plasma
Applied Physics Letters
Astronomy
Physics
Heating of Tungsten Target by Intense Pulse Electron Beam