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Publications by Rita Van Ham
The Use of Time-Of-Flight Static Secondary Ion Mass Spectrometry Imaging for the Molecular Characterization of Single Aerosol Surfaces
Analytica Chimica Acta
Biochemistry
Environmental Chemistry
Analytical Chemistry
Spectroscopy
Related publications
Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging
Microscopy and Microanalysis
Instrumentation
Chemical Imaging of Buried Interfaces in OrganicInorganic Devices Using Focused Ion Beam-Time-Of-Flight-Secondary-Ion Mass Spectrometry
Gridless Ion Acceleration Systems for Time-Of-Flight Mass Spectrometry
Journal of the American Society for Mass Spectrometry
Structural Biology
Spectroscopy
Development of Quantitative Techniques With Time-Of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for Li Characterization in High Energy Batteries.
Microscopy and Microanalysis
Instrumentation
Characterization of Secondary Organic Aerosol Precursors Using Two-Dimensional Gas Chromatography With Time of Flight Mass Spectrometry (GC×GC/TOFMS)
Imaging and Quantitative Analysis of Insecticide in Mosquito Net Fibers Using Time-Of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
PLoS ONE
Multidisciplinary
Investigation of Silver Nanoparticle Induced Lipids Changes on a Single Cell Surface by Time-Of-Flight Secondary Ion Mass Spectrometry
Development of Source Apportionment of Individual Particle by High Resolution Time of Flight-Secondary Ion Mass Spectrometry
Journal of the Vacuum Society of Japan
Surfaces
Instrumentation
Interfaces
Spectroscopy
Materials Science
Single Particle Characterization of Ultrafine and Accumulation Mode Particles From Heavy Duty Diesel Vehicles Using Aerosol Time-Of-Flight Mass Spectrometry
