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Publications by Russell M. Gwilliam

Modeling and Experimental Characterization of Stepped and V-Shaped {311} Defects in Silicon

Journal of Applied Physics
AstronomyPhysics
2014English

Related publications

Characterization and Modeling of Sidewall Defects in Selective Epitaxial Growth of Silicon

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
1995English

Scanning Tunneling Microscopy and Spectroscopy of NaCl Overlayers on the Stepped Cu(311) Surface: Experimental and Theoretical Study

Physical Review B
2005English

Ab-Initio Modeling of Point Defects, Impurities and Diffusion in Silicon

ECS Meeting Abstracts
2008English

Electron Spin Resonance and Optical Characterization of Defects in Microcrystalline Silicon

Journal of Non-Crystalline Solids
Condensed Matter PhysicsMaterials ChemistryOpticalMagnetic MaterialsCompositesElectronicCeramics
2000English

Cross-Sectional Transmission Electron Microscopy Analysis of {311} Defects From Si Implantation Into Silicon

Applied Physics Letters
AstronomyPhysics
1998English

Structure, Defects, and Strain in Silicon-Silicon Oxide Interfaces

Journal of Applied Physics
AstronomyPhysics
2014English

Defects in Silicon

Reports on Progress in Physics
MedicineAstronomyPhysics
1982English

Synthesis, Characterization, Modeling and Anti-Bacterial Properties of Peanut-Shaped ZnO Nano-Bunches

Nano Hybrids
2013English

Intrinsic Defects in Silicon

Materials Science in Semiconductor Processing
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2000English

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