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Publications by S Kellogg
High Throughput Sample Preparation and Analysis Using an Inductively Coupled Plasma (ICP) Focused Ion Beam Source
Microscopy and Microanalysis
Instrumentation
Related publications
High Brightness Inductively Coupled Plasma Source for High Current Focused Ion Beam Applications
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Focused Ion Beam Based Sample Preparation Techniques
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Instrumentation
Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
Inductively Coupled Plasma (ICP) Emission Spectroscopic Analysis of Manganese Minerals
Journal of the Mineralogical Society of Japan
A Sample Preparation Method for Paper Cross-Sections Using a Focused Ion Beam.
Sen'i Gakkaishi
Materials Science
Industrial
Polymers
Manufacturing Engineering
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Focused Ion Beam: Much More Than a Sample Preparation Tool
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Focused Ion Beam Preparation Techniques for EFTEM Analysis
Microscopy and Microanalysis
Instrumentation
Marriage of Focused and Broad Ion Beam: Sample Preparation Optimized for High Performance Analytical (S)TEM
Microscopy and Microanalysis
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Control and Analysis of Ion Species in Inductively Coupled Nitration Plasma Using a Grid System
Applied Physics Letters
Astronomy
Physics
