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Publications by S. Demirezen
On the Profile of Frequency and Voltage Dependent Interface States and Series Resistance in (Ni/Au)/Al0.22Ga0.78N/AlN/GaN Heterostructures by Using Current–voltage (I–V) and Admittance Spectroscopy Methods
Microelectronics Reliability
Surfaces
Electronic Engineering
Condensed Matter Physics
Electronic
Molecular Physics,
Nanoscience
Films
Optical
Electrical
Atomic
Magnetic Materials
Nanotechnology
Reliability
Safety
Coatings
Optics
Quality
Risk
