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Publications by S. H. Zeng

Influence of Backsurface Argon Bombardment on SiO2–Si Interface Characteristics

Applied Physics Letters

English

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Mechanical Stability of Ultrathin Ge∕Si Film on SiO2: The Effect of Si∕SiO2 Interface

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Structures and Electronic States of Si/SiO2 Interface.

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Study of SiO2/Si Interface by Surface Techniques

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On the C-Si/SiO2 Interface Recombination Parameters From Photo-Conductance Decay Measurements

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Influence of Nanocrystal Size on Optical Properties of Si Nanocrystals Embedded in SiO2 Synthesized by Si Ion Implantation

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Spatially Resolved Vibrational Electron Energy-Loss Spectroscopy Across an Abrupt SiO2/Si Interface

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Study of High Temperature Reaction Between Ti and SiO2 at Interface in Ti/SiO2/TiSi2/Si System by XPS.

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Effect of Argon Ion Bombardment on Diffusion Bonding of SUS304L Stainless Steel and Pure Iron.

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Structure of PbTe(SiO2)/SiO2multilayers Deposited on Si(111)

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