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Publications by Sanjay V. Khare

Evidence From Simulations for Orientational Medium Range Order in Fluctuation-Electron-Microscopy Observations of A-Si

Microscopy and Microanalysis
Instrumentation
2004English

Related publications

Medium-Range Order in Amorphous Silicon Measured by Fluctuation Electron Microscopy: Final Report, 23 June 1999--23 August 2002

2003English

Fluctuation Electron Microscopy for the MASses

Microscopy and Microanalysis
Instrumentation
2005English

Simulation of Decoherence in Fluctuation Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2013English

Dynamics of AMPA Receptors From Simulations and Electron Microscopy

Biophysical Journal
Biophysics
2019English

Tilted Fluctuation Electron Microscopy Characterization of Magnetically Anisotropic Amorphous Metal Films

Microscopy and Microanalysis
Instrumentation
2019English

CASINO Monte Carlo Simulations of Scanning Transmission Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2010English

Short-Range and Medium Range Order in Non Crystalline Rare Earth Iron Garnets

Le Journal de Physique Colloques
1985English

In Situ Observations Using Ultrahigh Vacuum Scanning Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2003English

Ab Initiotransmission Electron Microscopy Image Simulations of coherentAg−MgOinterfaces

Physical Review B
2004English

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