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Publications by Sergey Rubanov

Localised Charging Effects Induced in Nonconductive Materials During Focused Ion Beam Milling

Microscopy and Microanalysis

Instrumentation

English

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Localised Charging Effects Induced by Low Voltage Sem Operation in Non-Conductive Materials

Microscopy and Microanalysis

Instrumentation

English

The Sputtering Behavior of Polymeric Materials During Focused Ion Beam Nanomachining

Microscopy and Microanalysis

Instrumentation

English

Focused-Ion Beam Induced Deposition of Copper

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

English

Electron Microscopy of Cryo-Sectioned Skeletal Muscle by Focused Ion Beam Milling

Biophysical Journal

English

Strain Relaxation Induced Microphotoluminescence Characteristics of a Single InGaN-based Nanopillar Fabricated by Focused Ion Beam Milling

Applied Physics Letters

English

Fabrication of Sub-5 Nm Nanochannels in Insulating Substrates Using Focused Ion Beam Milling

Materials Science

Condensed Matter Physics

Mechanical Engineering

English

In Situ Microfluidic Cryofixation for Cryo Focused Ion Beam Milling and Cryo Electron Tomography

Scientific Reports

Multidisciplinary

English

Focused Ion Beam Tomography

English

Sub-Micron Grating Fabrication on Hafnium Oxide Thin-Film Waveguides With Focused Ion-Beam Milling

Molecular Physics,

English