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Publications by Shiang-Yao Jeng
Characterization of Write-Once Blu-Ray Disk Containing Cu–Al/Si Recording Layer Using Transmission Electron Microscopy
Applied Physics Letters
Astronomy
Physics
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Defect Characterization Using Transmission Scanning Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Direct Observation of Domains and Discommensurations in Mn-Si-Al Octagonal Quasicrystal by Transmission Electron Microscopy
Physical Review Letters
Astronomy
Physics
Nitridation Mechanism of Si Compacts Studied by Transmission Electron Microscopy
Materials Transactions, JIM
Contrast Enhancement for Lipid NanoParticles (LNPs) Characterization Using Transmission Electron Microscopy (TEM)
Microscopy and Microanalysis
Instrumentation
Microstructural Characterization of the Cu-TiB2 Alloy by Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Transmission Electron Microscopy
Springer Series in Optical Sciences
Optical
Electronic
Magnetic Materials
Analysis of a Wafer Bonded Ge∕Si Heterojunction by Transmission Electron Microscopy
Applied Physics Letters
Astronomy
Physics
Characterization of Carbon-Coated Titania Nanoparticles With Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
SCANNING ELECTRON MICROSCOPY IDENTIFICATION OF INTERMETALLIC PHASES IN Al-Si CAST ALLOYS
Acta Metallurgica Slovaca - Conference
