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Publications by Shigeyuki Morishita
Resolution Achievement of 40.5 Pm in Scanning Transmission Electron Microscopy Using 300 kV Microscope With Delta Corrector
Microscopy and Microanalysis
Instrumentation
Improvement of TEM Spatial Resolution at Low Accelerating Voltages (15-30 kV) With Monochromator
Microscopy and Microanalysis
Instrumentation
Observation of Atomic Columns by Diffractive Imaging^|^mdash;Reconstruction of the Si Dumbbell Structure From a Selected Area Diffraction Pattern^|^mdash;
Materia Japan
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