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Publications by Shingo Ichimura

Development of Si/SiO2 Multilayer Type AFM Tip Characterizers

Journal of Surface Analysis

English

Industrial Application of Surface and Interface Analysis. The Reliability of the Quantitative Analysis With AES.

Bulletin of the Japan Institute of Metals

English

Related publications

Mechanical Stability of Ultrathin Ge∕Si Film on SiO2: The Effect of Si∕SiO2 Interface

Journal of Applied Physics

English

Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip Limit

English

Electroluminescence and Photoluminescence of Ge‐implanted Si/SiO2/Si Structures

Applied Physics Letters

English

2p-274 Development of Tip-Scan Type of High-Speed AFM for Cell Imaging(Bioengineering,The 47th Annual Meeting of the Biophysical Society of Japan)

Seibutsu Butsuri

English

Porous Si-SiO2 Based UV Microcavities

Scientific Reports

Multidisciplinary

English

Effect of the Tip Size on AFM Cantilever Based Force Sensor

Journal of Sensors

Systems Engineering

Instrumentation

Electronic Engineering

English

Fabrication of Polydimethylsiloxane Nanofluidic Chips Under AFM Tip-Based Nanomilling Process

Nanoscale Research Letters

Materials Science

Condensed Matter Physics

English

Evaluation of Tip Performance by XE-100 Atomic Force Microscopy (AFM)

Microscopy and Microanalysis

Instrumentation

English

The OPTICAL PROPERTIES OF MULTILAYER PERIODIC STRUCTURES BaTiO3:Eu/SiO2

English