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Publications by Simon Hettler
Non-Diffractive Electron Bessel Beams for Scanning Electron Microscopy in Transmission Mode Using Direct Phase Masks
Microscopy and Microanalysis
Instrumentation
A Nanocrystalline Hilbert Phase-Plate for Phase-Contrast Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Related publications
Defect Characterization Using Transmission Scanning Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Crystal Structure Analysis Using Scanning Transmission Electron Microscopy
Nihon Kessho Gakkaishi
Differential Phase Contrast Scanning Transmission Electron Microscopy at Atomic Resolution
Microscopy and Microanalysis
Instrumentation
Simulating Inelastic Scattering in Scanning Transmission Electron Microscopy Using μSTEM
Microscopy and Microanalysis
Instrumentation
Direct Visualization of Magnetic Skyrmion by Aberration-Corrected Differential Phase Contrast Scanning Transmission Electron Microscopy
Nanoscale Diffractive Probing of Strain Dynamics in Ultrafast Transmission Electron Microscopy
Structural Dynamics
Instrumentation
Radiation
Condensed Matter Physics
Spectroscopy
Advanced Phase Reconstruction Methods Enabled by Four-Dimensional Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Direct Electron Detectors for Electron Microscopy
Charge Density Mapping via Scanning Diffraction in Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
