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Publications by Stefan Eichenberger

Localization and Electrical Characterization of Interconnect Open Defects

IEEE Transactions on Semiconductor Manufacturing

Electronic Engineering

Condensed Matter Physics

Manufacturing Engineering

Magnetic Materials

English

Gate Leakage Impact on Full Open Defects in Interconnect Lines

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Electronic Engineering

English

Related publications

In-Situ Electrical Characterization of Nano-Interconnect Structure in FIB

Microscopy and Microanalysis

Instrumentation

English

Electrical Characterization of Sputter Deposition Induced Defects in N-GaN

MRS Internet Journal of Nitride Semiconductor Research

English

Electrical and Photoelectrical Characterization of Deep Defects in Cubic GaN on GaAs

MRS Internet Journal of Nitride Semiconductor Research

English

Mechanical, Geometrical, and Electrical Characterization of Silicon Membranes for Open Stencil Masks

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

English

Electrical Characterization of Defects Induced by Electron Beam Exposure in Low Doped N -GaAs

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

High Energy Physics

Instrumentation

English

Electrical Characterization of Defects Introduced During Sputter Deposition of Tungsten on N Type 4 H -SiC

Materials Science in Semiconductor Processing

Mechanics of Materials

Materials Science

Condensed Matter Physics

Mechanical Engineering

English

Efficient Approach for Electrical Design and Analysis of High-Speed Interconnect in Integrated Circuit Packages

Electronics (Switzerland)

Electronic Engineering

Signal Processing

Computer Networks

Systems Engineering

English

Drosophila Laminin: Characterization and Localization

Journal of Cell Biology

English