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Publications by Stephan Uhlemann
Chromatic Aberration Correction for Atomic Resolution TEM Imaging From 20 to 80 kV
Physical Review Letters
Astronomy
Physics
Benefits and Possibilities of Cc–Correction for TEM / STEM
Microscopy and Microanalysis
Instrumentation
Experimental Set-Up of a Purely Electrostatic Monochromator for High Resolution and Analytical Purposes of a 200 KV TEM
Microscopy and Microanalysis
Instrumentation
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