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Publications by Suk Chung
Quantitative Dopant Profiling of P-N Junction in InGaAs∕AlGaAs Light-Emitting Diode Using Off-Axis Electron Holography
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology
Related publications
Observing a P-N Junction in a Reverse-Biased GaP Light-Emitting Diode by Combining Electron Holography and Focused-Ion-Beam Milling
Microscopy and Microanalysis
Instrumentation
Quantitative Examination of Reverse-Biased Semiconductor Devices Using Off- Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Issues Affecting Quantitative Evaluation of Dopant Profiles Using Electron Holography
Microscopy and Microanalysis
Instrumentation
Magnetic Imaging of Skyrmions in FeGe Using Off-Axis Electron Holography
Characterization of Multilayer Ferromagnetic Nanowire Arrays Using Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Live Measurement of Electrical Charge Density in Materials Using Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Exploring CCD Camera Parameters With Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Junction–temperature Measurement in GaN Ultraviolet Light-Emitting Diodes Using Diode Forward Voltage Method
Applied Physics Letters
Astronomy
Physics
InGaN/GaN Light-Emitting Diode With a Polarization Tunnel Junction
Applied Physics Letters
Astronomy
Physics
