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Publications by SungWook Park
Investigation of Simulated and Measured Program Characteristicsin 4-Bit/Cell Charge-Trap Flash (CTF) Memories
Journal of the Korean Physical Society
Astronomy
Physics
Related publications
A Subthreshold Slope and Low-Frequency Noise Characteristics in Charge Trap Flash Memories With Gate-All-Around and Planar Structure
Journal of Semiconductor Technology and Science
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Comparative Study of Charge Trapping Type SOI-FinFET Flash Memories With Different Blocking Layer Materials
Journal of Low Power Electronics and Applications
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Data Movement in Flash Memories
Verify Level Control Criteria for Multi-Level Cell Flash Memories and Their Applications
Eurasip Journal on Advances in Signal Processing
Hardware
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Partial Rank Modulation for Flash Memories
Comparative Investigation of Endurance and Bias Temperature Instability Characteristics in Metal-Al2O3-Nitride-Oxide-Semiconductor (MANOS) and Semiconductor-Oxide-Nitride-Oxide-Semiconductor (SONOS) Charge Trap Flash Memory
Journal of Semiconductor Technology and Science
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FSAF: File System Aware Flash Translation Layer for NAND Flash Memories
Bit Error Generation for NAND Flash Memory
A 3mW, 250 MSamples/sec, 4-Bit Current-Mode FLASH Analog-To-Digital Converter.
