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Publications by T Agemura

Surface Sensitive and Compositional SEM Imaging for High Accelerating Voltages in Focused Ion/Electron Beam Systems

Microscopy and Microanalysis

Instrumentation

English

Related publications

Focused Ion Beam-Sem as a Tool for Versatile Quantitative Imaging of Cellular Structures

Biophysical Journal

English

Focused Ion Beam (FIB) Based Tomography of Dislocations Using Electron Channeling Contrast Imaging (ECCI)

Microscopy and Microanalysis

Instrumentation

English

Three-Dimensional Analysis Using Focused Ion Beam and Electron Microscope

Vacuum and Surface Science

English

3D Imaging of the Early Embryonic Chicken Heart With Focused Ion Beam Scanning Electron Microscopy

Microscopy and Microanalysis

Instrumentation

English

In Situ Microfluidic Cryofixation for Cryo Focused Ion Beam Milling and Cryo Electron Tomography

Scientific Reports

Multidisciplinary

English

Diamond Processing by Focused Ion Beam—surface Damage and Recovery

Applied Physics Letters

English

Focused Ion Beam Technique for Surface and Interface Analysis of Steel Sheets

Journal of The Surface Finishing Society of Japan

English

Three-Dimensional Cathodoluminescence by Focused Ion Beam - Scanning Electron Microscopy

Microscopy and Microanalysis

Instrumentation

English

Focused Ion Beam Tomography

English