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Publications by T. Conard

Medium Energy Ion Scattering for the High Depth Resolution Characterisation of High-K Dielectric Layers of Nanometer Thickness

Applied Surface Science

Condensed Matter Physics

English

Aqueous Solution–gel Preparation of Ultrathin ZrO2 Films for Gate Dielectric Application

Thin Solid Films

Materials Chemistry

Magnetic Materials

English

Related publications

The Structure of SrTiO3(001)-2 × 1 Surface Analyzed by High-Resolution Medium Energy Ion Scattering Coupled With Ab Initio Calculations

Journal of Chemical Physics

Theoretical Chemistry

English

Medium Modification ofγJets in High-Energy Heavy-Ion Collisions

Physical Review Letters

English

Dielectric Coatings for High Energy Lasers

English

High-Resolution Dielectric Profiling of Ice Cores

Journal of Glaciology

Earth-Surface Processes

English

Atomic Layer Deposition of High-K Dielectric Layers on Ge and III-V MOS Channels

ECS Meeting Abstracts

English

High-Energy Scattering of Hadrons.

English

Atomic Layer Deposition of High-K Dielectric Layers on Ge and III-V MOS Channels

English

High-K Dielectric Sulfur-Selenium Alloys

Science advances

Multidisciplinary

English

Key Concepts for Extending the Depth of Field With High Resolution

Optica Pura y Aplicada

Mechanical Engineering

Molecular Physics,

Magnetic Materials

English