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Publications by T. J. Godfrey
Sharpening and Positioning of Regions of Interest in Atom Probe Samples Using In-Situ Sputtering
Microscopy and Microanalysis
Instrumentation
Related publications
Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM
Microscopy and Microanalysis
Instrumentation
Mapping Isotopes in Nanoscale and Quantum Materials Using Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Tracking Structural Modifications From In-Situ Atom Probe Gas-Solid Reactions Through Computational Homology
Microscopy and Microanalysis
Instrumentation
Fluorescence in Situ Hybridization Method Using a Peptide Nucleic Acid Probe for Identification of Salmonella Spp. In a Broad Spectrum of Samples
Applied and Environmental Microbiology
Applied Microbiology
Biotechnology
Ecology
Food Science
New Applications in Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Understanding Corrosion of 304 Stainless Steels Using Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Atom-Probe Analysis of Zircaloy
Le Journal de Physique Colloques
Efficient in Situ Barcode Sequencing Using Padlock Probe-Based BaristaSeq
Nucleic Acids Research
Genetics
Simplifying Observation of Hydrogen Trapping in Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
