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Publications by T. Nishimula
Band-Offset Determination at Ge/GeO2 Interface by Internal Photoemission and Charge-Corrected X-Ray Photo-Electron Spectroscopies
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Band Alignment at Memristive Metal-Oxide Interfaces Investigated by Hard X-Ray Photoemission Spectroscopy
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Energy Filtered X-Ray Photoemission Electron Microscopy
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Valence Band and Core Levels of Ce5Ni2Si3Crystal Studied by X-Ray Photoemission Spectroscopy
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Phase Quantification by X-Ray Photoemission Valence Band Analysis Applied to Mixed Phase TiO 2 Powders
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