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Publications by T. Pavelka
Quantitative Copper Measurement in Oxidized P-Type Silicon Wafers Using Microwave Photoconductivity Decay
Applied Physics Letters
Astronomy
Physics
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Effect of Ultrasonic Strain on P-Type Silicon Wafers
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Mo Contamination Inp/P+Epitaxial Silicon Wafers
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Detailed Investigation of Surface Passivation Methods for Lifetime Measurements on P-Type Silicon Wafers
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>21% Efficient Silicon Heterojunction Solar Cells on N- And P-Type Wafers Compared
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Monocrystalline Silicon Carbide Wafers Processing
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NOISE AND DIFFUSION IN P-Type SILICON
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Modeling of Photoconductivity of Porous Silicon
Advances in OptoElectronics
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Surface Grafting of Polypyrrole Onto Silicon Wafers
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Mirror Polishing of Silicon Wafers (4th Report)
Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering
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