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Publications by T.C. Eck

Product Certification by Automated Microscopy in an Industrial Setting

Microscopy and Microanalysis
Instrumentation
2003English

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Quantitative High-Throughput Population Dynamics in Continuous-Culture by Automated Microscopy

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Long-Path FTIR Measurements of Volatile Organic Compounds in an Industrial Setting

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Automated Structure Discovery in Atomic Force Microscopy

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New Product Development (NPD) Process – An Example of Industrial Sector

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