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Publications by T.O. Rerup

Using the Λ Function to Evaluate Probe Measurements of Charged Dielectric Surfaces

IEEE Transactions on Dielectrics and Electrical Insulation

Electronic Engineering

English

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Precise Dielectric Property Measurements and E-Field Probe Calibration for Specific Absorption Rate Measurements Using a Rectangular Waveguide

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Proper Controls to Electrochemically Evaluate Carotenoids Using Β-Cyclodextrin Modified Surfaces

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Using the Quartz Crystal Microbalance With Dissipation Monitoring to Evaluate the Size of Nanoparticles Deposited on Surfaces

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Laser Raman Measurements of Dielectric Coatings as a Function of Temperature

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On the Moments of the Carmichael Λ Function

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Scanning Probe Energy Loss Spectroscopy: Angular Resolved Measurements on Silicon and Graphite Surfaces

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Dielectric Properties of Tequila in the Microwave Frequency Range (0.5–20 GHz) Using Coaxial Probe

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Dielectric Characterization of Vegetation at L Band Using an Open-Ended Coaxial Probe

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Dielectric Characterization of Vegetation at L-Band Using an Open-Ended Coaxial Probe

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