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Publications by Takeshi Sunaoshi
Expanding the Depth of Field for Imaging With Low keV Electrons: High Resolution Surface Observations of Nanostructured LaB6 Using Low keV Secondary and Backscattered Electrons
Microscopy and Microanalysis
Instrumentation
STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging at ≤ 30 kV With No Aberration Correction for Nanomaterials on Graphene Support
Microscopy and Microanalysis
Instrumentation
Related publications
Computation of &Ldquo;Equivalent Thickness” Of Surface Films in Composite Targetes for About 25 keV Electrons
Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
Mechanics of Materials
Alloys
Materials Chemistry
Condensed Matter Physics
Metals
Backscattered Electrons Signal for Imunolocalization of Trypanosoma Cruzi Surface Antigens
Microscopy and Microanalysis
Instrumentation
Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope
Microscopy and Microanalysis
Instrumentation
High-Resolution Evaluation of the U5(n,f) Cross Section From 3 keV to 30 keV
EPJ Web of Conferences
Astronomy
Physics
DNA Comet Assay for Rice Seeds Treated With Low Energy Electrons ("Soft-Electrons").
FOOD IRRADIATION, JAPAN
Effects of Fast Secondary Electrons to Low-Voltage Electron Beam Lithography
Journal of Micro/ Nanolithography, MEMS, and MOEMS
Electronic Engineering
Condensed Matter Physics
Mechanical Engineering
Electronic
Molecular Physics,
Nanoscience
Optical
Electrical
Atomic
Magnetic Materials
Nanotechnology
Optics
Collisionless Effects on the Spectrum of Secondary Auroral Electrons at Low Altitudes.
Silicon Photodiodes for Low Penetration Depth Beams Such as DUV/VUV/EUV Light and Low-Energy Electrons
Repeatability of Automated FIB Prepared TEM Samples With Low keV Cleaning
Microscopy and Microanalysis
Instrumentation
