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Publications by Takuji HOSOI
Structural Characterization of Very Thin Strained Si Layers by Synchrotron X-Ray Topography
Nihon Kessho Gakkaishi
Related publications
Synchrotron Topography and X-Ray Diffraction Study of GaInP Layers Grown on GaAs/Ge
Journal of Crystal Growth
Inorganic Chemistry
Materials Chemistry
Condensed Matter Physics
Characterization of Defects Evolution in Bulk SiC by Synchrotron X-Ray Imaging
Current Status of Material Characterization by Synchrotron Radiation Nanobeam X-Ray Diffraction
Nihon Kessho Gakkaishi
Elemental Distribution and Structural Characterization of GaN/InGaN Core-Shell Single Nanowires by Hard X-Ray Synchrotron Nanoprobes
Nanomaterials
Materials Science
Chemical Engineering
X-Ray Topography
Synchrotron Radiography and X-Ray Topography Studies of Hexagonal Habitus SiC Bulk Crystals
Journal of Materials Research
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Characterization of Thin Polymer Films by Neutron and X-Ray Reflectometry
Kobunshi
Materials Science
Polymers
Plastics
Chemical Engineering
Environmental Science
Synchrotron-Radiation X-Ray Topography and Diffractometry Below 1 K by Means of Helium-3 Dilution Refrigerator
Acta Crystallographica Section A Foundations of Crystallography
X-Ray Diffraction Topography
