Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by Ted Vorburger
Analysis of Dimensional Metrology Standards
Related publications
TSOM Method for Nanoelectronics Dimensional Metrology
Metrology and Standards Needs for Some Categories of Medical Devices
Journal of Research of the National Institute of Standards and Technology
Engineering
Morphological Method for Surface Metrology and Dimensional Metrology Based on the Alpha Shape
Measurement Science and Technology
Instrumentation
Engineering
Applied Mathematics
Non-Contact Optical Three Dimensional Liner Metrology
Submicrometer Microelectronics Dimensional Metrology: Scanning Electron Microscopy
Journal of Research of the National Bureau of Standards
Advanced Metrology for Nanoelectronics at the National Institute of Standards and Technology
A Wireless Sensor Network-Based Approach to Large-Scale Dimensional Metrology
International Journal of Computer Integrated Manufacturing
Electronic Engineering
Industrial
Mechanical Engineering
Manufacturing Engineering
Computer Science Applications
Electrical
Aerospace Engineering
Toward Superfast Three-Dimensional Optical Metrology With Digital Micromirror Device Platforms
Optical Engineering
Engineering
Optics
Atomic
Molecular Physics,
Development of a New Hybrid Approach Combining AFM and SEM for the Nanoparticle Dimensional Metrology
Beilstein Journal of Nanotechnology
Electronic Engineering
Materials Science
Nanoscience
Electrical
Nanotechnology
Astronomy
Physics