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Publications by Teijiro Mori
Influence of Arc Current on the Wear of Copper Electrodes in Air
IEEJ Transactions on Power and Energy
Electronic Engineering
Power Technology
Electrical
Energy Engineering
Related publications
Effect of Inrush Current on Carbon Nanotube Synthesis From Xylene by Liquid-Phase Pulsed Arc Method Using Copper Electrodes
e-Journal of Surface Science and Nanotechnology
Surfaces
Mechanics of Materials
Condensed Matter Physics
Interfaces
Nanoscience
Bioengineering
Films
Biotechnology
Coatings
Nanotechnology
High Current Densities in Copper Microcoils: Influence of Substrate on Failure Mode
Microsystem Technologies
Electronic Engineering
Condensed Matter Physics
Nanoscience
Hardware
Optical
Electrical
Architecture
Magnetic Materials
Nanotechnology
Electronic
Characteristics of the Arc on Breaking Contact in Air
Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
Mechanics of Materials
Alloys
Materials Chemistry
Condensed Matter Physics
Metals
Influence of an Explosion Air Shock Wave on Arc Quenching Inside a Cylinder
AIP Advances
Nanotechnology
Astronomy
Physics
Nanoscience
Mutual Influence of the Melting Stage and Electric Arc Current Harmonic Composition in Different Types of Electric Arc Furnaces
International Journal of Computing and Digital Systems
Computer Graphics
Human-Computer Interaction
Computer Networks
Communications
Information Systems
Computer-Aided Design
Innovation
Management of Technology
Artificial Intelligence
Influence of Neuroticism on Denture Wear
Prosthodontic Research & Practice
Influence of External Axial Magnetic Field on the Characteristics of a High-Current Arc in a Vacuum Circuit Breaker
Izvestiya vysshikh uchebnykh zavedenii. Fizika
Numerical Modelling of High-Pressure Arc Discharges: Matching the LTE Arc Core With the Electrodes
Journal of Physics D: Applied Physics
Surfaces
Ultrasonics
Condensed Matter Physics
Acoustics
Optical
Magnetic Materials
Films
Coatings
Electronic
Influence of the Contact Area on the Current Density Across Molecular Tunneling Junctions Measured With EGaIn Top-Electrodes
