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Publications by Thomas Juffmann

Reducing Electron Beam Damage With Multipass Transmission Electron Microscopy

Microscopy and Microanalysis

Instrumentation

English

Related publications

Transmission Electron Microscopy

Springer Series in Optical Sciences

Magnetic Materials

English

Electron Beam Induced Domain Motion in Ferroelectric RKTP Observed by Transmission Electron Microscopy

Microscopy and Microanalysis

Instrumentation

English

Analytical Transmission Electron Microscopy

Reviews in Mineralogy and Geochemistry

English

Multiple-Beam Scanning Electron Microscopy

Microscopy Today

English

How to Resolveab-Initionanostructures by Electron Diffraction: Applications of Beam Precession in Transmission Electron Microscopy

Acta Crystallographica Section A Foundations of Crystallography

English

High-Resolution Transmission Electron Microscopy.

English

Interfacing Microfluidics With Negative Stain Transmission Electron Microscopy

Analytical Chemistry

Analytical Chemistry

English

Analysis of Nanostructures With Scanning Transmission Electron Microscopy

Microscopy and Microanalysis

Instrumentation

English

Radiation Damage Haloes in Biotite Investigated Using High-Resolution Transmission Electron Microscopy

American Mineralogist

English