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Publications by Thomas W. Scharf
Tribochemistry and Material Transfer for the Ultrananocrystalline Diamond-Silicon Nitride Interface Revealed by X-Ray Photoelectron Emission Spectromicroscopy
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Related publications
Transfer of Electrons on Scratched Iron Surfaces: Photoelectron Emission and X-Ray Photoelectron Spectroscopy Studies
Friction
Surfaces
Films
Coatings
Mechanical Engineering
Evaluation of Joined Silicon Nitride by X-Ray Computed Tomography (X-Ray CT)
Journal of the Ceramic Society of Japan
Materials Chemistry
Chemistry
Condensed Matter Physics
Composites
Ceramics
X‐ray Photoelectron Diffraction of (100)‐oriented Chemical Vapor Deposited Diamond Films on Silicon (100)
Applied Physics Letters
Astronomy
Physics
Diamond Genesis Revealed by X-Ray Tomography of Diamondiferous Eclogites
Unusual Valence State in the Antiperovskites Sr3SnO and Sr3PbO Revealed by X-Ray Photoelectron Spectroscopy
Physical Review Materials
Materials Science
Astronomy
Physics
Electronic Structure and the Valence State ofYb2Pd2SnandYbPd2Snstudied by Photoelectron and Resonant X-Ray Emission Spectroscopies
Physical Review B
Interface Science Using Ambient Pressure Hard X-Ray Photoelectron Spectroscopy
Surfaces
X-Ray Residual Stress Measurement of Silicon Nitride by Gaussian Curve Method.
Transactions of the Japan Society of Mechanical Engineers Series A
Physical Chemistry of the Mn/ZnO (0001̅) Interface Probed by Hard X-Ray Photoelectron Spectroscopy
Journal of Physical Chemistry C
Surfaces
Energy
Nanoscience
Theoretical Chemistry
Optical
Magnetic Materials
Films
Nanotechnology
Electronic
Coatings
Physical
